Etched track morphology in SiO2irradiated with swift heavy ions
نویسندگان
چکیده
منابع مشابه
Microstructural changes of graphite irradiated with swift heavy ions
Several methods, such as electron microscopy, scanning tunnelling microscopy (STM), X-ray diffraction, and decoration technique can be used to observe radiation damage in materials. In this work, we report microstructural changes and defect clusters induced by swift heavy ions (SHI) on graphite surfaces, visualized by scanning electron microscopy (SEM). Our studies have been performed on fine-g...
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Irradiation of highly oriented pyrolytic graphite (HOPG) with swift heavy ions demonstrated that damage of the material is originated by electronic energy loss [1]. To support further analysis of experimental data from Raman spectroscopy, electron microscopy, X-ray scattering, etc., some assumptions about damage structure are necessary. It is reasonable to assume that not only primary Frenkel d...
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ژورنال
عنوان ژورنال: Lithuanian Journal of Physics
سال: 2009
ISSN: 1648-8504
DOI: 10.3952/lithjphys.49113